MIMO Design of 12x64 Element Polarization Sensitive SiGe Array for 3D In-line Detection of Defects at 220-260 GHz-Reference-Cited by-同舟云学术

MIMO Design of 12x64 Element Polarization Sensitive SiGe Array for 3D In-line Detection of Defects at 220-260 GHz

Published:2022-08-28 Issue: Volume: Page:
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Container-title:2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz)
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Author:

Kahl Matthias¹,Weisenstein Christian¹,Hussung Raphael²,Keil Andreas²,Friederich Fabian²,Bolivar Peter Haring¹

Affiliation:

1. University of Siegen,High Frequency and Quantum Electronics,Germany

2. Fraunhofer Institute for Industrial Mathematics ITWM,Kaiserslautern,Germany

Funder

Ministry of Education

Publisher

IEEE

Link

Reference4 articles.

1. Conception and realization of a semiconductor based 240 GHz full 3d MIMO imaging system;weisenstein;Terahertz RF Millimeter and Submillimeter-Wave Technology and Applications VII,2017

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2. SiGe MIMO In-line Imager with 12x64 Elements for Real-time 3D Image Acquisition;2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz);2023-09-17

3. High-Power and High-Efficiency 1.3 THz Transmitter Using Discrete Schottky Diode Technology;2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz);2023-09-17