Author:
Michalski Alexander,Sawallich Simon,True John,Asadizanjani Navid,Nagel Michael
Cited by
4 articles.
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1. Enhancing counterfeit detection of integrated circuits through machine learning-assisted THz-TDS analysis;Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVII;2024-03-11
2. THz-TDS for IC packaging material changes detection under real-world conditions;Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVII;2024-03-11
3. Microprobe-based Terahertz Near-field Imaging of Highly Scattering Pharmaceutical Coatings on Small Tablets;2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz);2023-09-17
4. A Comprehensive Taxonomy of Visual Printed Circuit Board Defects;Journal of Hardware and Systems Security;2023-04-24