Enhancing counterfeit detection of integrated circuits through machine learning-assisted THz-TDS analysis-Reference-Cited by-同舟云学术

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Enhancing counterfeit detection of integrated circuits through machine learning-assisted THz-TDS analysis

Published:2024-03-11 Issue: Volume: Page:
ISSN:
Container-title:Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVII
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Author:

Xi Chengjie,Varshney Nitin,Khan Mohammad Shafkat M.,Dalir Hamed,Asadizanjani Navid

Publisher

SPIE

Reference35 articles.

1. Counterfeit Integrated Circuits

2. Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead

3. Counterfeit integrated circuits: A rising threat in the global semiconductor supply chain;Guin,2014

4. A Survey of Hardware Trojan Taxonomy and Detection

5. Hardware deprocessing using voltage imaging for hardware assurance;Tehranipoor,2023

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Evaluating a Multimodal, Non-Destructive Approach Combining a Resonant Cavity System and Infrared Spectroscopy to Detect Counterfeit and Anomalous Integrated Circuits;IEEE Transactions on Components, Packaging and Manufacturing Technology;2024-07

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