Author:
Bui Tin Quang,Pham Lam Dang,Nguyen Hieu Minh,Nguyen Viet Thai,Le Thong Chi,Hoang Trang
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. SRAM Memory Testing Methods and Analysis;Advances in Systems Analysis, Software Engineering, and High Performance Computing;2023-12-18
2. Multi-type SRAM Test Structure with an Improved March LR Algorithm;2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS);2022-11-11
3. Scalable and Rapid Fault Detection of Memories Using MBIST and Signature Analysis;Lecture Notes in Electrical Engineering;2021