ADC Testing Using a Resonator-Based Observer: Processing Very Long Time Records and/or Testing Systems With Limited Stability
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx5/19/6493455/06341079.pdf?arnumber=6341079
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. An Improved Sine Wave Histogram Test Method for ADC Characterization;IEEE Transactions on Instrumentation and Measurement;2019-10
2. Accurate Spectral Testing with Arbitrary Non-coherency in Sampling and Simultaneous Drifts in Amplitude and Frequency;Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements;2018
3. Accurate Spectral Testing With Arbitrary Noncoherency in Sampling and Simultaneous Drifts in Amplitude and Frequency;IEEE Transactions on Instrumentation and Measurement;2017-05
4. ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling;Journal of Electronic Testing;2017-01-26
5. Efficient Implementation of Least Squares Sine Fitting Algorithms;IEEE Transactions on Instrumentation and Measurement;2016-12
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