ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling
Author:
Funder
Semiconductor Research Corporation
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-017-5642-4.pdf
Reference24 articles.
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3. Belega D, Dallet D, Petri D (2010) Estimation of the effective number of bits of ADCs using the interpolated DFT method. Proc. IEEE Instrumentation and Measurement Technology Conference, pp. 30–35
4. Bilau TZ, Megyeri T, Sarhegyi A, Markus J, Kollar I (2004) Four parameter fitting of sine wave testing result: iteration and convergence. Computer Standards and Interfaces 26:51–56
5. Burns M, Roberts GW (2000) An introduction to mixed-signal IC test and measurement. Oxford University Press, New York
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