Author:
Coppage F. N.,Evans D. C.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
5 articles.
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1. Study of latch-up immunization in bulk CMOS integrated circuits exposed to transient ionizing radiation;Science China Technological Sciences;2012-05-25
2. Radiation Effects;Encyclopedia of RF and Microwave Engineering;2005-04-15
3. Transient ionizing radiation effects in devices and circuits;IEEE Transactions on Nuclear Science;2003-06
4. Radiation Effects;Wiley Encyclopedia of Electrical and Electronics Engineering;1999-12-27
5. La cryomicroélectronique;Journal de Physique III;1991-02