Author:
Natale Giorgio Di,Doulcier Marion,Flottes Marie-Lise,Rouzeyre Bruno
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
22 articles.
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1. IEEE 1838 compliant scan encryption and integrity for 2.5/3D ICs;2024 IEEE European Test Symposium (ETS);2024-05-20
2. BALoo: First and Efficient Countermeasure Dedicated to Persistent Fault Attacks;2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS);2023-07-03
3. A Survey of Chips Security Technology Based on Scan Chain;2023 International Symposium of Electronics Design Automation (ISEDA);2023-05-08
4. Defense against Security Threats with Regard to SoC Life Cycle;Frontiers of Quality Electronic Design (QED);2023
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