A Low Area Overhead NBTI/PBTI Sensor for SRAM Memories

Author:

Karimi MaryamORCID,Rohbani Nezam,Miremadi Seyed-GhassemORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. An Aging Detection and Tolerance Framework for 8T SRAM Dot Product CIM Engine;2022 19th International SoC Design Conference (ISOCC);2022-10-19

2. An Aging-Aware CMOS SRAM Structure Design for Boolean Logic In-Memory Computing;2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2021-10-06

3. Series diode‐connected current mirror based linear and sensitive negative bias temperature instability monitoring circuit;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2021-09-12

4. High throughput SRAM design for improved computing in autonomous systems;International Journal of Intelligent Unmanned Systems;2021-08-24

5. SRAM Gauge: SRAM Health Monitoring via Cells Race;2021 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED);2021-07-26

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