Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation,Electrical and Electronic Engineering,Instrumentation
Reference10 articles.
1. Effects of PRBS jitter on random demodulation analog-to-information converters
2. A reduced-code method for integral nonlinearity testing in DACs
3. PRBS Selection for Velocity Measurements with Compressive Sampling-Based DS-CDMA Radio Navigation Receivers
4. PRBS non-idealites affecting random demodulation analog-to-information converters;daponte;Proc 21st IMEKO TC4 Int Symp on Understanding the World through Elect and Electron Meas and 19th Int Workshop on ADC Model and Testing,0
5. Experimental comparison of two mathematical models for Analog-to-Information Converter;daponte;Proc 21st IMEKO TC4 Int Symp on Understanding the World through Elect and Electron Meas and 19th Int Workshop on ADC Model and Testing,0
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11 articles.
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