Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments-Reference-Cited by-同舟云学术

Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments

Published:2017-01 Issue:1 Volume:64 Page:45-53
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Goiffon Vincent,Rolando Sebastien,Corbiere Franck,Rizzolo Serena,Chabane Aziouz,Girard Sylvain,Baer Jeremy,Estribeau Magali,Magnan Pierre,Paillet Philippe,Van Uffelen Marco,Mont Casellas Laura,Scott Robin,Gaillardin Marc,Marcandella Claude,Marcelot Olivier,Allanche Timothe

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/7869239/07776887.pdf?arnumber=7776887

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