EMI Susceptibility of a Digitally Based Analog Amplifier in a 180-nm CMOS Process-Reference-Cited by-同舟云学术

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EMI Susceptibility of a Digitally Based Analog Amplifier in a 180-nm CMOS Process

Published:2016-08 Issue:4 Volume:58 Page:1236-1239
ISSN:0018-9375
Container-title:IEEE Transactions on Electromagnetic Compatibility
language:
Short-container-title:IEEE Trans. Electromagn. Compat.

Author:

Coccoli Alberto,Richelli Anna^ORCID,Redoute Jean-Michel

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Link

http://xplorestaging.ieee.org/ielx7/15/7524058/07466845.pdf?arnumber=7466845

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Susceptibility of the Instrumentation to Conducted EMI Injected Through the Ground Plane;IEEE Transactions on Electromagnetic Compatibility;2023-08

2. Increasing EMI Immunity and Linearity of a CMOS 180 nm Voltage-to-Delay Converter;Electronics;2022-04-07

3. EMI Effect in Voltage-to-Time Converters;IEEE Transactions on Circuits and Systems II: Express Briefs;2021-04

4. Design of an Ultra-Low Voltage Bias Current Generator Highly Immune to Electromagnetic Interference;Journal of Low Power Electronics and Applications;2021-01-20

5. EMI Effects in CMOS Time-Mode Circuits;2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE;2020-09-23

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