Increasing EMI Immunity and Linearity of a CMOS 180 nm Voltage-to-Delay Converter

Abstract

This paper presents a voltage-controlled delay unit (VCDU) with a novel architecture allowing for a wide input range of linearity and an improved immunity to electromagnetic interferences. The circuit is based on a current-starved inverter with a biasing technique to extend the input voltage range of linearity near to the rail-to-rail linearity range. The proposed scheme was designed by UMC 180 nm standard CMOS process and works without power-hungry amplifiers or comparators. It has a voltage supply of 1.8 V and exhibits a rail-to-rail linearity range (0–1.8 V) with an average EMI-induced jitter of only 1% of the nominal delay.