GaN HEMT devices: Experimental results on normally-on, normally-off and cascode configuration
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Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/6683943/6699103/06699239.pdf?arnumber=6699239
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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2. From wide to ultrawide-bandgap semiconductors for high power and high frequency electronic devices;Journal of Physics: Materials;2024-03-08
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4. Low Buffer Trapping Effects above 1200 V in Normally off GaN-on-Silicon Field Effect Transistors;Micromachines;2022-09-14
5. GaN-based power devices: Physics, reliability, and perspectives;Journal of Applied Physics;2021-11-14
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