First Integration of 10-V CMOS Logic Circuit, 20-V Gate Driver, and 600-V VDMOSFET on a 4H-SiC Single Chip

Author:

Tsui B. Y.1,Hung C. L.1,Tsai T. K.1,Tsui Y. C.1,Wang T. W.1,Wen Y. X.1,Shih C. P.1,Wang J. C.1,Lin L. J.1,Wang C. H.1,Chu K. W.1,Chen P. H.1

Affiliation:

1. National Yang Ming Chiao Tung University,Institute of Electronics,Taiwan,R.O.C,30010

Funder

Ministry of Science and Technology

Publisher

IEEE

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Metal Contact on P-Type 4H-SiC With Low Specific Contact Resistance and Micrometer-Scale Contact Area;IEEE Electron Device Letters;2023-09

2. A Study on the Impact of Gamma Rays Irradiation on 4H-SiC CMOSFETs;2023 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia);2023-08-27

3. Integrated Lateral SBD Temperature Sensor of a 4H-SiC VDMOS for Real-Time Temperature Monitoring;IEEE Transactions on Electron Devices;2023-07

4. Bias-Induced Instability of 4H-SiC CMOS;Materials Science Forum;2023-06-06

5. A SiC 3D Power IC Directly Integrating a Power MOSFET With Its CMOS Gate Driver Using Flip Chip Bonding;2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD);2023-05-28

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