Lifetime Control Free Cathode Side Concept for Si-Based Power Diode Targeting High-Speed Operation and High Dynamic Ruggedness

Author:

Nakamura Katsumi1,Tanaka Koji2,Takeda Naoyuki1,Suzuki Mikihito1,Kawase Yusuke1

Affiliation:

1. Mitsubishi Electric Corporation,Power Semiconductor Device Development Dept. Power Device Works,Kumamoto,Japan

2. Mitsubishi Electric Corporation,Power Semiconductor Device Development Dept. Power Device Works,Fukuoka,Japan

Publisher

IEEE

Reference11 articles.

1. Advanced Cathode and Anode Injection Control Con-cept for 1200 V SC (Schottky Controlled Injection)-Diode;matsudai;Proc ISPSD,0

2. A Novel Buffer Structure and Lifetime Control Technique with Poly-Si for Thin Wafer Diode;fujii;Proc ISPSD,2009

3. The Second Stage of a Thin Wafer IGBT Low Loss 1200V LPT-CSTBT™ with a Backside Doping Optimization Process

4. Fabrication of IGBTs using 300 mm magnetic Czochralski substrates

5. N-Buffer Design for Silicon-Based Power Diode Targeting High Dynamic Robustness and High Operating Temperature Over 448 K

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