Soft Error Reliability Prediction of SRAM-based FPGA Designs
Author:
Affiliation:
1. Politecnico di Torino,Department of Control and Computer Engineering (DAUIN),Turin,Italy
2. European Space Agency,Noordwijk,The Netherlands
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10412245/10412349/10412546.pdf?arnumber=10412546
Reference10 articles.
1. Run-Time Recovery Mechanism for Transient and Permanent Hardware Faults Based on Distributed, Self-Organized Dynamic Partially Reconfigurable Systems
2. Radiation-induced soft errors in advanced semiconductor technologies
3. Single-Event Characterization of the 28 nm Xilinx Kintex-7 Field-Programmable Gate Array under Heavy Ion Irradiation
4. A Comprehensive Methodology for Complex Field Programmable Gate Array Single Event Effects Test and Evaluation
5. Domain Crossing Errors: Limitations on Single Device Triple-Modular Redundancy Circuits in Xilinx FPGAs
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