Single-Event Characterization of the 28 nm Xilinx Kintex-7 Field-Programmable Gate Array under Heavy Ion Irradiation
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Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/6996671/7004502/07004595.pdf?arnumber=7004595
Cited by 27 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Design and Implementation of a High-Speed Low-Power K-Nearest-Neighbor-Based Algorithm for Detecting Micro-Single-Event Latchups;IEEE Transactions on Nuclear Science;2024-08
2. Electron-Induced Single-Event Effect in 28 nm SRAM-Based FPGA;Electronics;2024-06-07
3. Reliability Modeling of Fault-Tolerant FPGA-Based Architectures in Space Applications for Soft and Hard Error Recovery;IEEE Access;2024
4. A Data Pre-Processing Module for Improved-Accuracy Machine-Learning-based Micro-Single-Event-Latchup Detection;2023 IEEE 9th International Conference on Space Mission Challenges for Information Technology (SMC-IT);2023-07
5. Neutron Radiation Testing of RISC-V TMR Soft Processors on SRAM-Based FPGAs;IEEE Transactions on Nuclear Science;2023-04
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