Author:
van den Berg Ardy,Ren Pengwei,Marinissen Erik Jan,Gaydadjiev Georgi,Goossens Kees
Cited by
6 articles.
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1. Reusing IEEE 1687-Compatible Instruments and Sub-Networks over a System Bus;2022 IEEE International Test Conference (ITC);2022-09
2. En voie de;Revue Romane / Langue et littérature. International Journal of Romance Languages and Literatures;2019-07-22
3. Test-Delivery Optimization in Manycore SOCs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2014-07
4. Optimization of Test Pin-Count, Test Scheduling, and Test Access for NoC-Based Multicore SoCs;IEEE Transactions on Computers;2014-03
5. Proposed Solution;Embedded Systems;2010-09-23