Author:
Gordeev V.P.,Oleshchenko V.A.,Bezotosnyi V.V.
Abstract
Abstract
Comparative results are presented of 3D-calculation for thermoelastic stress (TES) profiles in diode laser arrays (LDAs) assembled on CuW and AlN submounts (temperature compensators) and operating at a continuous-wave (CW) thermal power load of up to 220 W. For the first time, the simulation has revealed substantial differences in the maximal TES values for the arrays assembled on CuW and AlN submounts, as well as pronounced features of TES distribution in LDA assemblies, in particular, near the rear (highly reflecting) mirror of the laser diode cavity in similar geometries of temperature compensators. Results of the numerical simulation qualitatively agree with thorough measurements of spectral distributions over the LDA emitting aperture. The obtained results are interesting for mastering the production technologies of high-power devices aimed at improving their output parameters and service life.
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Statistical and Nonlinear Physics,Electronic, Optical and Magnetic Materials