Stochastic inequalities involving past extropy of order statistics and past extropy of record values

Author:

Shrahili Mansour1,Kayid Mohamed1,Mesfioui Mhamed2

Affiliation:

1. Department of Statistics and Operations Research, College of Science, King Saud University, P.O. Box 2455, Riyadh 11451, Saudi Arabia

2. Département de mathématiques et d'informatique, Université du Québec à Trois-Rivières, 3351, boulevard des Forges, Trois-Rivières (Québec) Canada G9A 5H7

Abstract

<abstract><p>Recently, extropy has emerged as an alternative measure of uncertainty instead of entropy. When it comes to quantifying uncertainty regarding the remaining lifetime of a component, entropy has proven to be less effective. Therefore, the concept of residual entropy was introduced to address this limitation. Similar to the residual entropy, the residual extropy was formulated and used to investigate the uncertainty in the residual lifetime of a unit. Systems in the real world exhibit a pervasive property of uncertainty that affects future events and past events. For this reason, the concept of past extropy was introduced to specifically capture and analyze the uncertainty associated with past events. This paper focuses on stochastic aspects, including stochastic orderings, which provide useful inequalities related to past extropy when applied to order statistics and lower record values. It is worth noting that the past extropy of the $ i $th-order statistics and record values in the continuous case is related to the past extropy of the $ i $th-order statistics and record values evaluated from the uniform distribution. The monotonicity of the past extropy of order statistics is examined and some insights into the past extropy of lower data set values are also given. Finally, some computational results are presented. In fact, an estimator for the extropy of the exponential distribution is proposed. For this purpose, the maximum likelihood estimator is derived. The proposed method is easy to implement and apply from a computational point of view.</p></abstract>

Publisher

American Institute of Mathematical Sciences (AIMS)

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