Author:
Polozhii H.E.,Ponomarev A.G.,Kolinko S.V.,Rebrov V.A.
Abstract
Vector method for scanning with focused beam of megaelectronvolt-energy in proton-beam writing is described. Vector proton-beam writing method was proven experimentally to have numerous advantages over raster method. Focused beam size and shape are measured by scanning standard copper mesh for e-beam microscopy. Prospectives
of hardware and software upgrade are regarded. Vector proton-beam writing technology can be used in many applications, including X-ray optics, electronics prototyping, microrobotics, microfluidics, photonics and microstructure fabrication in new materials.
Publisher
Problems of Atomic Science and Technology
Cited by
2 articles.
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