Measurement of wavefront aberration for high NA objective and some special problems
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Published:2016
Issue:3
Volume:24
Page:482-490
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ISSN:1004-924X
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Container-title:Optics and Precision Engineering
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language:en
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Short-container-title:光学 精密工程
Author:
LIU Zhi-xiang 刘志祥,XING Ting-wen 邢廷文,JIANG Ya-dong 蒋亚东,Lü Bao-bin 吕保斌
Publisher
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences
Subject
Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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