Author:
Liu Chuanjiang 刘川江,Wang Ao 王奥,Zhang Genyuan 张根源,Yuan Wei 袁伟,Liu Fenglin 刘丰林
Publisher
Shanghai Institute of Optics and Fine Mechanics
Reference37 articles.
1. Physical characterization and performance evaluation of an X-ray micro-computed tomography system for dimensional metrology applications;J Hiller;Measurement Science and Technology,2012
2. Industrial computer tomography for dimensional metrology: overview of influence factors and improvement strategies;K Kiekens,2009
3. A computer simulation platform for the estimation of measurement uncertainties in dimensional X-ray computed tomography;J Hiller;Measurement,2012
4. X-ray source translation based computed tomography (STCT);L Li;Optics Express,2021
5. Weighted filtered back-projection for source translation computed tomography reconstruction;J Chen;IEEE Transactions on Instrumentation and Measurement,2023