Physical characterization and performance evaluation of an x-ray micro-computed tomography system for dimensional metrology applications-Reference-Cited by-同舟云学术

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Physical characterization and performance evaluation of an x-ray micro-computed tomography system for dimensional metrology applications

Published:2012-06-14 Issue:8 Volume:23 Page:085404
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Hiller Jochen,Maisl Michael,Reindl Leonard M

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Link

http://stacks.iop.org/0957-0233/23/i=8/a=085404/pdf

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