Design of AFM system with high speed and large scanning range-Reference-Cited by-同舟云学术

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Design of AFM system with high speed and large scanning range

Published:2011 Issue:11 Volume:19 Page:2651-2656
ISSN:1004-924X
Container-title:Optics and Precision Engineering
language:en
Short-container-title:光学精密工程

Author:

YIN Bo-hua 殷伯华,CHEN Dai-xie 陈代谢,LIN Yun-sheng 林云生,CHU Ming-zhang 初明璋,HAN Li 韩立

Publisher

Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fast Scan mode of scanning electrochemical microscopy: In-situ characterization of phase transition and mapping the hydrogen evolution activity for MoS2;Nano Research;2023-05-01

2. Optimal Design of Micro/Nano Positioning Stage with Wide Range and High Speed Based on Flexure Structures;IOP Conference Series: Materials Science and Engineering;2017-12

3. Large Scanning Range and Rapid AFM for Biological Cell Topography Imaging;Key Engineering Materials;2013-07

4. Dual-Frequency Atomic Force Microscopy Imaging Method and Experiment Based on Commercial AFM Platform;Chinese Physics Letters;2013-06

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