Dual-Frequency Atomic Force Microscopy Imaging Method and Experiment Based on Commercial AFM Platform
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
https://iopscience.iop.org/article/10.1088/0256-307X/30/6/060702/pdf
Reference20 articles.
1. Atomic Force Microscope
2. Position measuring system in metrological atomic force microscope
3. Advances in atomic force microscopy
4. Design of AFM system with high speed and large scanning range
5. Tip Surface Interactions in STM and AFM
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1. Wavelet analysis of higher harmonics in tapping mode atomic force microscopy;Micron;2019-03
2. Measurement of frequency stability in tunable lasers by using an F-P interferometer;Optoelectronics Letters;2014-01
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