Study of X-ray Kirkpatrick-Baez imaging with single layer-Reference-Cited by-同舟云学术

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Study of X-ray Kirkpatrick-Baez imaging with single layer

Published:2009 Issue:5 Volume:7 Page:452-454
ISSN:1671-7694
Container-title:Chinese Optics Letters
language:en
Short-container-title:中国光学快报

Author:

Baozhong Mu 穆宝忠,Zhanshan Wang 王占山,Shengzhen Yi 伊圣振,Xin Wang 王新,Shengling Huang 黄圣铃,Jingtao Zhu 朱京涛,Chengchao Huang 黄承超

Publisher

Shanghai Institute of Optics and Fine Mechanics

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Monochromatic Kirkpatrick–Baez microscope combining a spherically bent crystal and a multilayer mirror;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2020-10

2. Key technologies and the performance measuring methods in variable included angle plane grating monochromator;Chinese Optics;2016

3. Kirkpatrick-Baez microscope for hard X-ray imaging of fast ignition experiments;Review of Scientific Instruments;2013-02

4. Large field-of-view X-ray imaging by using a Fresnel zone plate;Laser and Particle Beams;2012-01-05

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