SOFT ERRORS IN COMMERCIAL INTEGRATED CIRCUITS-Reference-Cited by-同舟云学术

SOFT ERRORS IN COMMERCIAL INTEGRATED CIRCUITS

Published:2004-06 Issue:02 Volume:14 Page:299-309
ISSN:0129-1564
Container-title:International Journal of High Speed Electronics and Systems
language:en
Short-container-title:Int. J. Hi. Spe. Ele. Syst.

Author:

BAUMANN R. C.¹

Affiliation:

1. Silicon Technology Development Group, Texas Instruments Inc., 13560 North Central Expressway, MS 3737, Dallas, Texas, USA

Abstract

The once-ephemeral soft error has recently caused considerable concern for manufacturers of advanced silicon technology as this phenomenon now has the potential for inducing the highest failure rate of all other reliability mechanisms combined. We briefly review the three radiation mechanisms responsible for causing soft errors in commercial electronics and the basic physical mechanism by which ionizing radiation can produce a soft error. We then focus on the soft error sensitivity trends in commercial DRAM, SRAM, and peripheral logic devices as a function of technology scaling and discuss some of the solutions used for mitigating the impact of soft errors in high reliability systems.

Publisher

World Scientific Pub Co Pte Lt

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Electronic, Optical and Magnetic Materials

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0129156404002363

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