Atomic Paths in Scanning of the AFM Tip above the Close-Packed Surface in Repulsive Mode-Reference-Cited by-同舟云学术

Atomic Paths in Scanning of the AFM Tip above the Close-Packed Surface in Repulsive Mode

Published:1998-10 Issue:05 Volume:05 Page:989-996
ISSN:0218-625X
Container-title:Surface Review and Letters
language:en
Short-container-title:Surf. Rev. Lett.

Author:

Blagov E. V.¹,Klimchitskaya G. L.²,Mostepanenko V. M.¹

Affiliation:

1. Research and Innovation Enterprise "Modus," Zagorodnoye shosse 8/7, Box 49, Moscow, 113152, Russia

2. North-West Polytechnical Institute, Department of Physics, Millionnaya str. 5, St. Petersburg, 191065, Russia

Abstract

The paths are calculated for the surface and tip apex atoms when scanning the AFM tip above the close-packed lattice in contact mode. The interaction of the sample and the tip atoms is considered in elastic approximation. The dependence of the atomic paths on the type of the tip and its orientation is investigated. It is shown that the vertical characteristic sizes of the atomic paths are several times larger than the vertical resolution of the atomic force microscope.

Publisher

World Scientific Pub Co Pte Lt

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0218625X98001341

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5. Effects of Atomic Arrangement at Tip Apex and Tip-Sample Distance on Atomic Force Microscopy Images: A Simulation Study