How to describe AFM constant force surfaces in repulsive mode?-Reference-Cited by-同舟云学术

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How to describe AFM constant force surfaces in repulsive mode?

Published:1996-04 Issue:2 Volume:349 Page:196-206
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Blagov E.V.,Klimchitskaya G.L.,Lobashov A.A.,Mostepanenko V.M.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference29 articles.

1. Atomic Force Microscope

2. Scanning Force Microscopy with Applications to Electric, Magnetic and Atomic Forces, Oxford Series on Optical Sciences;Sarid,1991

3. STM and SFM in Biology;Marti,1993

4. Scanning Tunneling Microscopy 3, Theory of STM and Related Scanning Probe Methods,1993

5. The AFM as a tool for surface imaging

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