Interface Structure and Preferred Orientation of Ag/Si(111) Revealed by X-Ray Diffraction

Abstract

We studied buried interface structures of [Formula: see text] and Ag/Si(111)-(7 × 7) samples using grazing incidence X-ray diffraction with synchrotron radiation. We also measured the crystal orientation of the Ag overlayers of the samples. Of the numerous [Formula: see text] structures, only boron-induced [Formula: see text] structure has been detected in buried interfaces. We studied the buried interface superstructure of Ag(26 nm thick)/[Formula: see text], and detected a [Formula: see text] fractional order reflection peak. This means that the [Formula: see text] structure remained at the interface. Our results for the crystal orientation of the Ag overlayers of [Formula: see text] showed that Ag{110}, Ag{100} and Ag{111} planes were grown on the surface. By measuring several samples prepared at various substrate temperatures, (290–370 K), we found a strong correlation between the appearance of interface [Formula: see text] structure and the growth of the Ag{110} plane. In contrast, our results for the crystal orientation of the Ag overlayers of Ag(26 nm thick)/Si(111)-(7 × 7) showed that only the Ag{111} plane was grown on the surface.