PULL-IN STABILITY OF A FRACTAL MEMS SYSTEM AND ITS PULL-IN PLATEAU-Reference-Cited by-同舟云学术

PULL-IN STABILITY OF A FRACTAL MEMS SYSTEM AND ITS PULL-IN PLATEAU

Published:2022-11-07 Issue:09 Volume:30 Page:
ISSN:0218-348X
Container-title:Fractals
language:en
Short-container-title:Fractals

Author:

HE JI-HUAN¹²³^ORCID,YANG QIAN¹,HE CHUN-HUI⁴,LI HAI-BIN⁵,BUHE EERDUN⁶

Affiliation:

1. School of Science, Xi’an University of Architecture and Technology, Xi’an, P. R. China

2. School of Mathematics and Information Science, Henan Polytechnic University, Jiaozuo, P. R. China

3. National Engineering Laboratory for Modern Silk, College of Textile and Clothing Engineering, Soochow University, Suzhou, P. R. China

4. School of Mathematics, China University of Mining and Technology, Xuzhou 221116, Jiangsu, P. R. China

5. School of Science, Inner Mongolia University of Technology, Hohhot 010051, P. R. China

6. School of Mathematics and Big Data, Hohhot University for Nationalities, Hohhot, P. R. China

Abstract

The pull-in instability is the inherent property of a micro-electromechanical system (MEMS) when the voltage is larger than its threshold value. Recently, a fractal MEMS system was proposed to overcome the pull-in instability with great success, and it has opened a total new path for the so-called pull-in stability. This paper suggests a pull-in plateau, a novel concept for qualifying the pull-in stability. The plateau’s basic properties are elucidated, and the effect of the fractal dimensions on the plateau width is elucidated, and the paper concludes that there exists a critical condition for an ever pull-in stability when both the acceleration and the speed of the system equal zero.

Funder

National Natural Science Foundation of China

Publisher

World Scientific Pub Co Pte Ltd

Subject

Applied Mathematics,Geometry and Topology,Modeling and Simulation

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0218348X22501857

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