SI/GE Quantum Dot Channel FETs for Multi-Bit Computing

Author:

Jain F.1ORCID,Gudlavalleti R. H.12ORCID,Chandy J.1ORCID,Heller E.3

Affiliation:

1. Electrical and Computer Engineering, University of Connecticut Storrs, CT, USA

2. Biorasis Inc., Storrs, CT, USA

3. Synopsys Inc. Ossining, NY, USA

Abstract

This paper presents quantum dot channel (QDC) FETs in quantum wire and coupled quantum dot configurations for cryogenic operation with multi-state operation. It also describes gate-all-around (GAA) quantum dot channel (QDC) FETs that exhibit potential multi-state characteristics at room temperature. FETs with cladded Si and Ge quantum dot layers as a transport channel have been fabricated. The formation of a quantum dot superlattice (QDSL) when SiOx-cladded Si and/or GeOx-cladded Ge quantum dots (QD) are assembled results in mini-energy sub-bands in the conduction and valence band. The intra-mini-energy band transitions results in significant changes in the drain current when gate and/or drain voltages are varied. This novel feature provides a pathway for 16-/32-state logic in CMOS-X configuration. The gate-defined Si quantum dot FETs, comprising of tunnel barrier coupled, have been reported for quantum computing at cryogenic temperatures.

Publisher

World Scientific Pub Co Pte Ltd

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