Investigation on relaxation phenomenon on sodium silicate (Na2SiO3) using complex impedance spectroscopy

Abstract

The relaxation property of sodium silicate [Formula: see text] (SS) was investigated by complex impedance spectroscopy (CIS) in a wide range of frequency (100[Formula: see text]kHz–5[Formula: see text]MHz) and temperature [Formula: see text]. Orthorhombic crystal phase was synthesized by a sintering process. The CIS study shows high complex impedance in low-frequency region due to strong dispersion and controls the relaxation mechanism of ions or cations in the crystal lattice. A decrease of the energy loss [Formula: see text] occurs with increasing frequency for all temperatures showing the normal behavior of SS. Relaxation time was calculated using the dielectric functions [Formula: see text] and [Formula: see text]. The temperature dependent relaxation plot follows the Arrhenius law, where the slope represents the activation energy.