Frequency-dependent dielectric properties of sodium silicate

Abstract

The dielectric properties of sodium silicate (Na2SiO3) (SS) have been investigated in a wide range of frequencies and temperatures. A strong dielectric dispersion is found to exist in low-frequency region. The frequency-dependent dielectric properties of SS follow the universal dynamic response proposed by Jonscher. The measured dielectric data strongly depends on dielectric dispersion and controls the basic relaxation property. However, the parameters that control the frequency-dependent dielectric properties such as coupling of ions or polarizability are found to have peak values at the frozen out condition or critical point.