ADMITTANCE FIELD METHOD FOR THE CALCULATION OF THE SPECTRAL DENSITY OF CURRENT FLUCTUATIONS-Reference-Cited by-同舟云学术

ADMITTANCE FIELD METHOD FOR THE CALCULATION OF THE SPECTRAL DENSITY OF CURRENT FLUCTUATIONS

Published:2001-03 Issue:01 Volume:01 Page:R1-R11
ISSN:0219-4775
Container-title:Fluctuation and Noise Letters
language:en
Short-container-title:Fluct. Noise Lett.

Author:

SHIKTOROV PAVEL¹,STARIKOV EVGENIJ¹,GRUŽINSKIS VIKTORAS¹,VARANI LUCA²,VAISSIERE JEAN-CLAUDE²,NOUGIER JEAN-PIERRE²,REGGIANI LINO³

Affiliation:

1. Semiconductor Physics Institute, Goshtauto 11, LT2600 Vilnius, Lithuania

2. Centre d'Electronique et de Micro-optoelectronique de Montpellier (CNRS UMR 5507), Université Montpellier II, 34095 Montpellier, France

3. Dipartimento di Scienza dei Materiali e Istituto Nazionale di Fisica della Materia, Universitá di Lecce, Via Arnesano, 73100 Lecce, Italy

Abstract

In the framework of the Green-function formalism the admittance field method is proposed for the calculation of the spectral density of current fluctuations of two and more terminal devices. The usefulness of the theory is illustrated by hydrodynamic calculations performed for a submicron GaAs structure. The unifying property of the formalism evidences the same physical ground of both the admittance and impedance field methods when instantaneous fluctuations of carrier accelerations during scattering events are taken as noise sources.

Publisher

World Scientific Pub Co Pte Lt

Subject

General Physics and Astronomy,General Mathematics

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0219477501000020

Reference13 articles.

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