Investigating the effect of laser surface melting process parameters on thermal efficiency by reverse analysis and experimental design

Author:

Afshari Mahmoud1,Khandaei Mehrdad1ORCID,Razavi Reza Shoja1,Barekat Seyed Masoud1

Affiliation:

1. Faculty of Materials and Manufacturing Technologies, Malek Ashtar University of Technology, Tehran, Iran

Abstract

In this paper, the effect of the process parameters such as laser power, shielding gas flow and scanning velocity on the actual laser power reaching the surface and thermal efficiency is investigated. For this purpose, the response surface methodology was used to investigate the effect of the process parameters at three levels. In order to measure the data from a 316L stainless steel, four k-type thermocouples are installed in different positions relative to the motion of the laser beam. The actual power was calculated by reverse analysis using the simulated annealing technique and the temperature history was measured by the thermocouples. The thermal model used is an optimized Rosenthal model, which is considered variable with temperature. The results show that for all thermocouples, the highest values of actual power that reached the surface were obtained at laser power of 200[Formula: see text]W, scanning velocity of 2[Formula: see text]mm/s and shielding gas flow of 30[Formula: see text]Lit/min. In addition, by increasing the laser power from 100 to 200[Formula: see text]W, the thermal efficiency decreases by about 4% to 12%. The thermal efficiency also decreases by about 8%, when the scanning velocity increased from 1 to 3[Formula: see text]mm/s. Moreover, the increase of the shielding gas flow from 25 to 35[Formula: see text]Lit/min initially improved the thermal efficiency and then decreased it. The models obtained from the analysis of variance in the heating cycle are in good agreement with the experimental results, but in the cooling cycle, the accuracy of this model decreases.

Publisher

World Scientific Pub Co Pte Ltd

Subject

Physics and Astronomy (miscellaneous),Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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