THERMAL STABILITY OF ENERGY-EMISSION FROM CdTe NANOCRYSTALS EMBEDDED IN SiO2 THIN FILMS-Reference-Cited by-同舟云学术

THERMAL STABILITY OF ENERGY-EMISSION FROM CdTe NANOCRYSTALS EMBEDDED IN SiO2 THIN FILMS

Published:2010-11-20 Issue:29 Volume:24 Page:2837-2843
ISSN:0217-9849
Container-title:Modern Physics Letters B
language:en
Short-container-title:Mod. Phys. Lett. B

Author:

LEVICHEV S.¹,CHAHBOUN A.¹²,ROLO A. G.¹,CONDE O.³,GOMES M. J. M.¹

Affiliation:

1. Physics Center, University of Minho, Braga, Portugal

2. LPS, Physics Department, Faculty of Sciences, Fés, Morocco

3. Physics Department, University of Lisbon and ICEMS, Lisbon, Portugal

Abstract

CdTe -doped SiO 2 thin films were produced by RF magnetron co-sputtering technique. Presence of CdTe nanocrystals inside the silica matrix was confirmed by Raman spectroscopy and grazing incidence X-ray diffraction. The samples demonstrate size dependent photoluminescence. Temperature dependent photoluminescence measurements were carried out in the temperature range 15–295 K and revealed energy-emission thermal stability. This feature can be usefully applied in a production of light-emitting diodes with wavelength stability in a wide temperature range.

Publisher

World Scientific Pub Co Pte Lt

Subject

Condensed Matter Physics,Statistical and Nonlinear Physics

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0217984910025206

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