Effect of Different Connection Patterns of MUX and DEMUX on Terminal Reliability and Routing Scheme of Gamma-Minus MIN

Author:

Gupta Shilpa1,Pahuja G. L.1

Affiliation:

1. Electrical Department, National Institute of Technology, Kurukshetra, Haryana, India

Abstract

In parallel and distributed systems, multistage interconnection network (MIN) plays an important role for its efficient communication between processor and memory at a very low cost. A major class of MIN called Gamma network is known for its redundant network topology and is being used in broadband communication systems. The increased redundancy incorporation makes these networks more complex and hence reliability evaluation becomes complex. The performance evaluation of these network topologies requires reliability evaluation utilizing routing mechanism or techniques. In this paper, we have proposed four topologies of Gamma-Minus network using MUX and DEMUX. Terminal Reliability (TR), fault tolerance and routing schemes of Gamma-Minus network topologies proposed have been computed by utilizing different connection patterns of MUX/DEMUX. Also, performance indices such as TR, Reliability Cost Ratio (RCR), Fault Tolerance, etc. computed for different Gamma-Minus architectures have been compared with the existing Gamma networks, other than Gamma-Minus. All the performance indices for different Gamma-Minus topologies show improvement over the performance indices of different Gamma networks. The proposed Gamma-Minus architectures have been compared among themselves and also Gamma-Minus2 shows the best performance for all performance indices. To the best of our knowledge, most of the researchers have not compared fault tolerance and RCR performance measure.

Publisher

World Scientific Pub Co Pte Lt

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Energy Engineering and Power Technology,Aerospace Engineering,Safety, Risk, Reliability and Quality,Nuclear Energy and Engineering,General Computer Science

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