DIAGNOSIS OF SPATIAL RESOLUTION FOR MICROBEAM SCANNING PIXE USING STIM METHOD AND CR-39 TRACK DETECTOR IN PASTA-Reference-Cited by-同舟云学术

DIAGNOSIS OF SPATIAL RESOLUTION FOR MICROBEAM SCANNING PIXE USING STIM METHOD AND CR-39 TRACK DETECTOR IN PASTA

Published:2003-01 Issue:01n02 Volume:13 Page:37-43
ISSN:0129-0835
Container-title:International Journal of PIXE
language:en
Short-container-title:Int. J. PIXE

Author:

Hamano T.¹,Imaseki H.¹,Yukawa M.¹,Ishikawa T.¹,Iso H.²,Matsumoto K.³

Affiliation:

1. National Institute of Radiological Sciences, 4-9-1 Anagawa, Inage-ku, Chiba 263-8555, Japan

2. Neosteck Co., 4-9-1 Anagawa, Inage-ku, Chiba 263-8555, Japan

3. Department of Physics, Toho University, 2-2-1 Miyama, Funabashi 274-8510, Japan

Abstract

In PIXE analysis system and Tandem Accelerator facility (PASTA) of NIRS, we are using Scanning Transmission Ion Microscopy (STIM) method and solid track detector to diagnose the spatial resolution of scanning microbeam PIXE analysis system. These methods are widely used by many microbeam facilities.

Publisher

World Scientific Pub Co Pte Lt

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0129083503000087

Reference10 articles.

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