Micro-PIXE analysis system at NIRS-electrostatic accelerator facility for various applications

Author:

Oikawa Masakazu1,Suya Noriyoshi1,Konishi Teruaki1,Ishikawa Takahiro1,Hamano Tsuyoshi1,Homma-Takeda Shino2

Affiliation:

1. Research, Development and Support Center, National Institute of Radiological Sciences, 4-9-1 Anagawa, Inage-ku, Chiba 263-8555, Japan

2. Research Center for Radiation Protection, National Institute of Radiological Sciences, 4-9-1 Anagawa, Inage-ku, Chiba 263-8555, Japan

Abstract

A micro-PIXE analysis system based on the ion beam analysis system by Oxford Microbeams Ltd. has been developed at the NIRS-electrostatic accelerator facility. The introduction of the CdTe X-ray detector dramatically improved the detection efficiencies for heavy elements that are important in the life sciences and environmental science. This system has been used for various projects and has provided several meaningful results, thus establishing the micro-PIXE system as an effective tool for the determination of elemental distribution with a high spatial resolution. In this paper, outline of the features of the micro-PIXE system at NIRS along with its recent application in research are introduced.

Publisher

World Scientific Pub Co Pte Lt

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Micro-PIXE imaging of the rib bones of rats;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-08

2. 64Cu2+ Complexes of Tripodal Amine Ligands’ In Vivo Tumor and Liver Uptakes and Intracellular Cu Distribution in the Extrahepatic Bile Duct Carcinoma Cell Line TFK-1: A Basic Comparative Study;Pharmaceuticals;2024-06-21

3. Characterization of trace elements in coal fly ash by extraction, micro-PIXE, TOF-SIMS, and XAFS;Waste Management;2023-02

4. Quantitative Analyses of Urinary Uranium by µ-PIXE;Minerals;2021-01-31

5. Analysis of SPICE microbeam size using fluorescent nuclear track detector (FNTD);Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-08

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