Atomic resolution microstructure study of Bi-doped SrTiO3

Author:

Li Chao1ORCID,Zhang Yijun2ORCID,Dong Guohua2ORCID,Hu Guangliang2ORCID,Yang Guang2ORCID,Liu Chaoqiang3ORCID,Chen Houwen3ORCID,Wei Xiaoyong2ORCID

Affiliation:

1. Instrumental Analysis Center, Xi’an Jiaotong University, Xi’an 710049, P. R. China

2. Electronic Materials Research Laboratory, Key Laboratory of The Ministry of Education & International, Center for Dielectric Research, Xi’an Jiaotong University, Xi’an 710049, P. R. China

3. College of Materials Science and Engineering & Electron Microscopy Center of Chongqing University, Chongqing University, Chongqing 400044, P. R. China

Abstract

Intrinsic SrTiO3 is a quantum paraelectric, but moderately Bi-doped SrTiO3 exhibits dielectric frequency dispersion similar to relaxor ferroelectrics. In this paper, detailed electron microscopic studies of the microstructures of Bi-doped SrTiO3 samples were presented. It was found that the Sr sites were replaced by off-central Bi, resulting in tensile strain in the strontium titanate (STO) lattice. In the Bi-doped SrTiO3 samples, the valence of titanium mainly showed the Ti[Formula: see text] characteristic. According to the dielectric behavior and microstructure analysis, the polar nanoregions (PNRs) composed of strained SrTiO3 nanoclusters should be responsible for the ferroelectric relaxor behavior in samples with moderate Bi content.

Funder

Natural Science Foundation of Shaanxi Province

National Basic Research Program of China

National Natural Science Foundation of China

Publisher

World Scientific Pub Co Pte Ltd

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