Author:
Haeni J. H.,Irvin P.,Chang W.,Uecker R.,Reiche P.,Li Y. L.,Choudhury S.,Tian W.,Hawley M. E.,Craigo B.,Tagantsev A. K.,Pan X. Q.,Streiffer S. K.,Chen L. Q.,Kirchoefer S. W.,Levy J.,Schlom D. G.
Publisher
Springer Science and Business Media LLC
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