DIFFERENTIAL-REFLECTANCE SPECTROSCOPY AND REFLECTANCE-ANISOTROPY SPECTROSCOPY ON SEMICONDUCTOR SURFACES-Reference-Cited by-同舟云学术

DIFFERENTIAL-REFLECTANCE SPECTROSCOPY AND REFLECTANCE-ANISOTROPY SPECTROSCOPY ON SEMICONDUCTOR SURFACES

Published:1999-06 Issue:03n04 Volume:06 Page:517-528
ISSN:0218-625X
Container-title:Surface Review and Letters
language:en
Short-container-title:Surf. Rev. Lett.

Author:

CHIARADIA P.¹,SOLE R. DEL¹

Affiliation:

1. Dipartimento di Fisica and INFM, Università di Roma Tor Vergata, Roma, Italy

Abstract

The development and the state of the art of surface methods based on the reflection of light are briefly reviewed. A short account is given of the main experimental and theoretical results obtained on semiconductor surfaces over about three decades.

Publisher

World Scientific Pub Co Pte Lt

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0218625X99000482

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