CORRELATION OF CRITICAL TEMPERATURES AND ELECTRICAL PROPERTIES IN TITANIUM FILMS-Reference-Cited by-同舟云学术

CORRELATION OF CRITICAL TEMPERATURES AND ELECTRICAL PROPERTIES IN TITANIUM FILMS

Published:2003-03-10 Issue:04n06 Volume:17 Page:948-952
ISSN:0217-9792
Container-title:International Journal of Modern Physics B
language:en
Short-container-title:Int. J. Mod. Phys. B

Author:

GANDINI C.¹,LACQUANITI V.¹,MONTICONE E.¹,PORTESI C.¹,RAJTERI M.¹,RASTELLO M. L.¹,PASCA E.²,VENTURA G.²

Affiliation:

1. Istituto Elettrotecnico Nazionale Galileo Ferraris, Strada delle Cacce 91, 10135 Torino, Italy

2. Department of Physics, University of Florence, Via Giovanni Sansone 1, Polo Scientifico di Sesto Fiorentino, 50019 Sesto F.no (FI), Italy

Abstract

Recently transition-edge sensors (TES) have obtained an increasing interest as light detectors due to their high energy resolution and broadband response. Titanium (Ti), with transition temperature up to 0.5 K, is among the suitable materials for TES application. In this work we investigate Ti films obtained from two materials of different purity deposited by e-gun on silicon nitride. Films with different thickness and deposition substrate temperature have been measured. Critical temperatures, electrical resistivities and structural properties obtained from x-ray are related to each other.

Publisher

World Scientific Pub Co Pte Lt

Subject

Condensed Matter Physics,Statistical and Nonlinear Physics

Link

https://www.worldscientific.com/doi/pdf/10.1142/S021797920301687X

Reference7 articles.

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