Fourier transform infrared spectroscopic study of gamma irradiated SiO2 nanoparticles

Abstract

In the present work, nano SiO2 particles are investigated before and after gamma irradiation (25, 50, 75, 100 and 200 kGy) using Fourier transform infrared (FTIR) spectroscopy method for the wavenumber between 400–4000 cm[Formula: see text]. It is found that as a result of spectroscopic analysis, five new peaks have appeared after gamma radiation. Two of new obtained peaks (which are located at 687 cm[Formula: see text] and 2357 cm[Formula: see text] of wavenumber) were formed as a result of gamma radiation interaction with Si–O bonds. Another three new peaks (peaks appropriate to 941, 2052 and 2357 cm[Formula: see text] values of wavenumber) appear as a result of interaction of water with nano SiO2 particles after gamma irradiation. It has been defined as asymmetrical bending vibration, symmetrical bending vibration, symmetrical stretching vibration and asymmetrical stretching vibration of Si–O bonds appropriate to peaks.