Affiliation:
1. School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, P. R. China
Abstract
Critical constituent gates are first detected and graded based on their individual impact of an error in the outputs. This brings in the idea of practical reliability analysis metric. Then, the approximation of arithmetic circuits by random logic applied to least significant gates is introduced. The 74283 fast adder is used as an example to illustrate the feasibility of the proposed methods. Simulation results show the potential efficient application of the proposed reliability analysis metric and approximation method.
Funder
National Natural Science Foundation of China
Qing Lan Project of Jiangsu Province
Publisher
World Scientific Pub Co Pte Lt
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Electrical and Electronic Engineering,Hardware and Architecture
Cited by
2 articles.
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