Application of atomic scale STEM techniquesto the study of interfaces and defects in materials-Reference-Cited by-同舟云学术

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Application of atomic scale STEM techniquesto the study of interfaces and defects in materials

Published:2001-05-01 Issue:3 Volume:50 Page:205-218
ISSN:2050-5698
Container-title:Microscopy
language:en
Short-container-title:Microscopy

Author:

Browning D.,Arslan I.,Ito Y.,James M.,Klie F.,Moeck P.,Topuria T.,Xin Y.

Publisher

Oxford University Press (OUP)

Subject

Radiology, Nuclear Medicine and imaging,Instrumentation,Structural Biology

Link

http://academic.oup.com/jmicro/article-pdf/50/3/205/2478690/500205.pdf

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1. Advances and Applications of Atomic-Resolution Scanning Transmission Electron Microscopy;Microscopy and Microanalysis;2021-08-20

2. Applications of STEM-EELS to complex oxides;Materials Science in Semiconductor Processing;2017-07

3. A novel aluminum based nanocomposite with high strength and good ductility;Journal of Alloys and Compounds;2015-11

4. Compositional mapping of semiconductor quantum dots and rings;Physics Reports;2011-04

5. Modeling of III-nitride light-emitting diodes: progress, problems, and perspectives;SPIE Proceedings;2011-02-10

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