Applications of STEM-EELS to complex oxides-Reference-Cited by-同舟云学术

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Applications of STEM-EELS to complex oxides

Published:2017-07 Issue: Volume:65 Page:49-63
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Gázquez Jaume,Sánchez-Santolino Gabriel,Biškup Neven,Roldán Manuel A.,Cabero M.,Pennycook Stephen J.,Varela María

Funder

Office of Basic Energy Sciences, Division of Materials Sciences and Engineering, U.S. Department of Energy

European Research Council Starting Investigator Award

Fundación BBVA

Spanish MINECO

Ramon Y Cajal Program

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference131 articles.

1. Chemically sensitive structure-imaging with a scanning transmission electron microscope;Pennycook;Nature,1988

2. Z-contrast stem for materials science;Pennycook;Ultramicroscopy,1989

3. High-resolution incoherent imaging of crystals;Pennycook;Phys. Rev. Lett.,1990

4. High-resolution Z-contrast imaging of crystals;Pennycook;Ultramicroscopy,1991

5. Direct determination of grain boundary atomic structure in SrTiO3;McGibbon;Science,1994

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